dc.contributor.author |
Musa, Sarhan M. |
|
dc.contributor.author |
Sadiku, Matthew N. O. |
|
dc.date.accessioned |
2018-07-05T09:52:57Z |
|
dc.date.available |
2018-07-05T09:52:57Z |
|
dc.date.issued |
2012 |
|
dc.identifier.issn |
2210-142X |
|
dc.identifier.uri |
http://10.7.0.19:8080/xmlui/handle/123456789/205 |
|
dc.description.abstract |
This paper presents the quasi-TEM approach for the analysis of unshielded multiconductor transmission lines interconnect in single and two-layered dielectric region using the finite element method (FEM). We mainly focus on designing of four-transmission lines embedded in two-layered dielectric media and five-transmission lines interconnect in single-layered dielectric medium. We compute the capacitance matrices for these configurations. Also, we determine the quasi-TEM spectral for the potential distribution of the integrated circuits. |
en_US |
dc.language.iso |
en_US |
en_US |
dc.publisher |
University of Bahrain |
en_US |
dc.rights |
Attribution-NonCommercial-ShareAlike 4.0 International |
* |
dc.rights.uri |
http://creativecommons.org/licenses/by-nc-sa/4.0/ |
* |
dc.subject |
Capacitance per unit length |
en_US |
dc.subject |
fnite element method |
en_US |
dc.subject |
VLSI |
en_US |
dc.subject |
multiconductor |
en_US |
dc.subject |
transmssion lines |
en_US |
dc.title |
Finite Element Approach of Unshielded Multiconductor Transmission Lines Embedded in Layered Dielectric Region for VLSI Circuits |
en_US |
dc.type |
Article |
en_US |
dc.identifier.doi |
http://dx.doi.org/10.12785/IJCDS/010104 |
|
dc.volume |
01 |
|
dc.issue |
01 |
|
dc.source.title |
International Journal of Computing and Digital Systems |
|
dc.abbreviatedsourcetitle |
IJCDS |
|